CAM cell in memory and its application 2021 OS concepts by VLSI Universe - June 14, 2021July 21, 20210 A content-addressable memory CAM (similar to SRAM) is an associative storage memory that addresses(searches) the content present in the computer. It compares the provided input data with the table of values and returns the address of matched data location. Basics of Content Addressable Memory(CAM) Content-addressed memory or CAM is like the combination of an SRAM with some added searching functionality to it. It does work like an SRAM such as it can read data from the particular memory location and it can write data on the intended memory location. Its main operation other than acting like an SRAM is performing a matching or searching operation. A valid search asserts the output match-line in other words an input value being found in the particular
Cache memory in detail and hit ratio June 2021 OS concepts by VLSI Universe - June 7, 2021July 21, 20210 In the computer architecture or computer organization (COA), cache memory is a very fast memory, which makes sure the data reach from the main memory to the CPU faster. We will discuss in detail the Cache hit ratio and types of cache memories in OS and The role of cache between CPU and main memory in computer organization and architecture. The cache is nothing but a buffer between CPU and RAM. Parameters like Cache hit, Cache miss, Miss rate, Miss Penalty, Cache block, Cache line, and Cache tag, we will understand all of them to increase the cache performance. We will discuss in detail the cache memory and its working, various types of cache memories, what is cache mapping in memories, and how does
Basics of Memory Testing in VLSI Memory BIST VLSI Design by VLSI Universe - May 30, 2021July 21, 20210 Memory is a very important component in the VLSI Semiconductor industry. In VLSI Circuits' memories play a key role in storing huge data. Memory testing in VLSI using Algorithms and Patterns efficiently is important. Built-in self test, self diagnosis, redundancy analysis and self repair. Various test algorithms which helps in testing of memories such as BIST compiler and BIST for RAM in Seconds. Memory faults and basics of checkerboard algorithm and march tests or algorithm will be discussed. Introduction to Memory Testing In the current situation the world is producing large amount of data which needs to stored in the memories. So memory technology is a growing technology in the semiconductor market. Understanding and improving the memory testing in VLSI is very important
