Basics of Memory Testing in VLSI Memory BIST VLSI Design by VLSI Universe - May 30, 2021July 21, 20210 Memory is a very important component in the VLSI Semiconductor industry. In VLSI Circuits' memories play a key role in storing huge data. Memory testing in VLSI using Algorithms and Patterns efficiently is important. Built-in self test, self diagnosis, redundancy analysis and self repair. Various test algorithms which helps in testing of memories such as BIST compiler and BIST for RAM in Seconds. Memory faults and basics of checkerboard algorithm and march tests or algorithm will be discussed. Introduction to Memory Testing In the current situation the world is producing large amount of data which needs to stored in the memories. So memory technology is a growing technology in the semiconductor market. Understanding and improving the memory testing in VLSI is very important
Basics of DFT in VLSI Scan Design and DFMA VLSI Design by VLSI Universe - May 29, 2021July 21, 20210 Let us talk about DFT in VLSI that is, Scan Design for Testing or Design for Testability and it is not Discrete Fourier Transform from Mathematics. Here the main purpose of the DFT Engineers in VLSI is to incorporate some extra logic structure in the design to make the testing easy, cost effective and efficient design for manufacturing and assembly (DFMA). Mainly here we are going to add some DFT testability features to design of a hardware product. After going through this post completely we must be able to answer all the following questions and the same these questions can be asked in VLSI interview. What is DFT in VLSI? Why DFT is used in VLSI? Why DFT is required? What is DFT architecture? What is
